Result description
The main result is the development of an equipment and the procedure for a fast and non-destructive evaluation of the homogeneity in chalcogenide thin films. This includes the fast evaluation and quantification of micro-defects such as pin holes, scratchs, thickness variation, phases segregation, etc.
Addressing target audiences and expressing needs
- Business partners – SMEs, Entrepreneurs, Large Corporations
- I/we wish to transfer my/our IPR to an interested party
- Expanding to more markets /finding new customers
We need partners for the scale-up of the equipment, and the possible industrialization. Additional partners that helps us to extend the application of the methodology towards new materials will be also required.
- Public or private funding institutions
- Other Actors who can help us fulfil our market potential
- Research and Technology Organisations
- Academia/ Universities
R&D, Technology and Innovation aspects
A fast, non-intrusive, non-destructive optical methodology for the homogeneity assessment of chalcogenide photovoltaic absorbers has been developed, based on tomography methods. The method can be applied to all chalcogenide materials under development for photovoltaic applications, and can be extended in the future to almost any kind of materials in the optoelectronic industry.
The current stage is TRL4. The targeted audiences are public funding institutions or private investors, in order to go towards the technology demonstration and future scale up.
Result submitted to Horizon Results Platform by HELMHOLTZ-ZENTRUM BERLIN FUR MATERIALIEN UND ENERGIE GMBH
