A probe and image-corrected (scanning) transmission electron microscope optimized for elemental analysis and high-resolution TEM/STEM imaging. The microscope is equipped with a monochromator, four energy-dispersive X-ray spectroscopy detectors and a GIF for electron energy loss spectroscopy (Dual EELS).

The microscope also has a bi-prism for electron holography. An in-situ sample holder allows heating and biasing experiments.