Gain deep insights into magnetic structures – with high-resolution Kerr microscopy for research, development, and quality control.
The IFW Dresden offers high-precision visualization and quantitative analysis of magnetic domain structures (in-plane & out-of-plane) on sample surfaces using state-of-the-art magneto-optical Kerr microscopy. We record local and global magnetization loops, analyze magnetic anisotropies, and investigate domains in thin and thick films as well as in engineering materials such as electrical steel, amorphous, and nanocrystalline ribbons. Our wide temperature and field range enables realistic operating conditions for your materials and components.
Your benefits
- Highest resolution up to 200 nm for precise domain analysis
- Wide range of applications from basic research to industrial testing
- Flexible measuring range : 10–800 K, up to 1 Tesla field strength
- Quantitative evaluation of domain patterns and anisotropies
- Experience & publication record in demanding measurement campaigns
Methods
- Direct Kerr microscopy & MOIF (magneto-optic indicator films)
- Local & global MOKE magnetometry
- Blue, red and white light for contrast-optimized display
- Adaptation of the measuring geometry to samples up to 30 × 300 mm
Fields of application
- Development and optimization of magnetic thin and thick films
- Quality control in electric steel and magnetic tape production
- Investigation of magnetic anisotropy in functional materials
- Troubleshooting and material characterization in magnet technology
