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OASIS – Material characterisation

Listing Description

General lab equipment for material characterisation is available such as SEM, TEM, optical microscope, AFM, X-ray diffraction, IR or Raman spectroscopy analysis to assess the structure, micro-structure and morphology of the material at the nano and micro-scale.

Offer Details

Specifications and Deliverables:

Microstructure / performance relationship analysis are performed thanks to ad-hoc designed particle characterization and quality control protocols.

Value Proposition:

Mechanical performance
Thermal properties management
Electrical properties management
Wear resistance

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Location and Map

Adress:

Parque Científico y Tecnológico de Gipuzkoa, Mikeletegi Pasealekua
Donostia
Gipuzkoa
20009
Spain

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