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XPS/UPS/AES/ISS /REELS ESCALAB 250Xi

Listing Description

An ultra-high vacuum (UHV) system to analyze the chemical composition of samples by means of X-ray Photoelectron Spectroscopy (XPS). It has a depth resolution of 1-10 nm via depth profiling and lateral resolution down to ~1 μm.

The complementary techniques that are also available are reflection electron energy loss spectroscopy (REELS), ion scattering spectroscopy (ISS) and ultraviolet photoelectron spectroscopy (UPS).

Offer Details

Specifications and Deliverables:

• Electron Analyser ( 0 – ±5000 eV)
• Detection System (6 channels, 2D position detector)
• X-ray Sources (Monochromatic Al K_x001F_ and twin anode
Mg K_x001F_/ Al K_x001F_)
• Sample Navigation and Manipulation (Automated
Sample Manipulator and Azimuthal stage Rotation)
• Heating and Cooling of Specimen
• UV Source
• Flood Sources (Charge compensation and REELS)
• Monoatomic and Gas Cluster Ion Source for depth
profiling “soft” (cluster mode) and solid (monoatomic
mode) materials

Value Proposition:

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Location and Map

Adress:

R. Dr. Carlos Lloyd Braga 49
Braga
Braga
4715-319
Portugal

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