In the era of rapid technological development of integrated photonics and the associated high demand for modern and efficient ways

Delaminations, cracks, impurities, porosities, wear or spalls are examples of effects which can be observed on the surface and cross-section

EDS (Energy Dispersive Spectroscopy) also known as Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray

The thickness of the layer is often a critical parameter that influences the usability of the manufactured elements. For special

One of the main use of the dual beam SEM/FIB (Scanning Electron Microscope) / (Focused Ion Beam) systems is the

The unique laser workstation, constructed by the Nanores team using independent elements, features a femtosecond laser, a highly precise tool

The fully automated NEMESIS 51000G2/A hardness tester allows for measurements using Brinell, Vickers, and Rockwell methods within the load range

Our advanced laboratory setup facilitates the preparation of material samples for in-depth analysis. We have the capability to perform imaging

The Olympus LEXT 3D confocal microscope allows for precise measurement of shape and surface roughness of samples at the submicron

Quanta 3D 200i ESEM/Ga-FIB microscope combines an electron microscope, based on a tungsten cathode, and an ion microscope. Its great

Helios G4 PFIB CXe is a dual beam microscope with an electron column and an ion column that generates a

The FEI dual beam SEM/Ga-FIB microscope combines the advantages of an ultra high-resolution electron microscope and an ion microscope. It