Surface and internal structure characterisation (physical, electronic and chemical properties) of materials down to the atomic scale:

– Transmission Electron Microscopy

– Probe-Corrected FEI Titan G2 80-200 kV ChemiSTEM

– Double-Corrected FEI Titan G3 Cubed Themis 60-300 kV

– JEOL JEM 2100 80-200 kV

– Cryo-Electron Microscope

– Thermo Scientific Glacios Cryo-Transmission Electron Microscope (Cryo-TEM); 200 kV, 12-grid Autoloader, and a state-of-the-art direct electron detector. System set up for single-particle analysis, cryo-electron tomography (cryo-ET) and micro-electron diffraction (MicroED).

– Scanning Electron Microscopy

– FEI Helios NanoLab 450S DualBeam – FIB with UHREM FEG-SEM

– FEI Quanta 650 FEG Environmental SEM (including Peltier and Heating Stage)

– In Situ TEM Holders

– FEI MEMS-based TEM heating and electrical holder

– 2 Gatan Cryo-TEM holders (FEI and JEOL microscopes)

– X-ray photoelectron spectroscopy

– Thermo Scientific Escalab 250 Xi