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Nanocharacterisation of materials and biological samples

Surface and internal structure characterisation (physical, electronic and chemical properties) of materials down to the atomic scale:

Transmission Electron Microscopy

Probe-Corrected FEI Titan G2 80-200 kV ChemiSTEM

Double-Corrected FEI Titan G3 Cubed Themis 60-300 kV

JEOL JEM 2100 80-200 kV

Cryo-Electron Microscope

Thermo Scientific Glacios Cryo-Transmission Electron Microscope (Cryo-TEM); 200 kV, 12-grid Autoloader, and a state-of-the-art direct electron detector. System set up for single-particle analysis, cryo-electron tomography (cryo-ET) and micro-electron diffraction (MicroED).

Scanning Electron Microscopy

FEI Helios NanoLab 450S DualBeam – FIB with UHREM FEG-SEM

FEI Quanta 650 FEG Environmental SEM (including Peltier and Heating Stage)

In Situ TEM Holders

FEI MEMS-based TEM heating and electrical holder

2 Gatan Cryo-TEM holders (FEI and JEOL microscopes)

X-ray photoelectron spectroscopy

Thermo Scientific Escalab 250 Xi


Value Proposition
The Advanced Electron Microscopy Imaging and Spectroscopy (AEMIS) facility at INL provides cutting-edge instrumentation and expertise for the characterization of materials and biological samples at the nano- and atomic scale. Tailored to the demanding needs of industries like clean energy, microelectronics, and personalized medicine, the facility allows for detailed research, quality control, nanotechnology development, and material properties optimization.

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