Popular
Scanning Electron Microscopy (SEM) and Environmental SEM
Equipment
FEI Quanta 650 FEG Environmental SEM (including Peltier and Heating Stage)
Hitachi SU-8000
JEOL JSM-IT-300LV
JEOL Neoscope JCM-
5000
Application examples
Ultra-high resolution surface imaging for morphological/topographical characterization, failure analysis and or contamination detection
Deliverables
Specifications and Deliverables
Voltage: 1 – 30 kV
SEM Imaging (Resolution 1 nm)
Low vacuum and Environmental SEM Imaging for sensitive materials and noncoated samples
EDXS (Chemical analysis)
Cooling/Heating stage (in-situ): –20 ºC –
1500 ºC
SE/BSE detectors (Topographical/Structural analysis)
SEM Imaging (Resolution 1 nm)
Low vacuum and Environmental SEM Imaging for sensitive materials and noncoated samples
EDXS (Chemical analysis)
Cooling/Heating stage (in-situ): –20 ºC –
1500 ºC
SE/BSE detectors (Topographical/Structural analysis)
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