Popular
Atomic Force Microscopy (AFM)
Equipment
Bruker Dimension 3000
Park Systems NX20
Nanosurf Easy Scan 2
NT-MDT NTEGRA SPM
Platform
Application examples
Surface topology characterisation, and surface physical properties at the nano-range
Deliverables
Specifications and Deliverables
Measurement modes: non-contact mode (topography), Conductive AFM, Piezo Force Microscopy (PFM), and Nanoindentation up to 100 μm × 100 μm scan area
Scan height up to 200 nm
Scan height up to 200 nm
Tag
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