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Atomic Force Microscopy (AFM)

Equipment

Bruker Dimension 3000
Park Systems NX20
Nanosurf Easy Scan 2
NT-MDT NTEGRA SPM
Platform

Application examples

Surface topology characterisation, and surface physical properties at the nano-range

Deliverables

Specifications and Deliverables
Measurement modes: non-contact mode (topography), Conductive AFM, Piezo Force Microscopy (PFM), and Nanoindentation up to 100 μm × 100 μm scan area
Scan height up to 200 nm

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user photo Patric Gerö viewed this listing at 2023-11-27 09:50:08
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