The thickness of the layer is often a critical parameter that influences the usability of the manufactured elements. For special coatings made of precious and semi-precious metals, their thickness must be strictly controlled within certain intervals.

The offered layer thickness measurement allows a precise determination of the layer thickness at the location specified by the customer. The high-resolution imaging mode allows the measurement of multilayer coatings with a thickness of a few nanometers.

During the thickness measurements, a local cross-section is created, whose surface is polished with the focused ion beam. This allows the analysis of the cross-section surface of the examined object with electron and ion microscopy techniques. These studies are perfect for the quality of sintered, welds and multi -layer structures (e.g. integrated circuits or anti -reflective coatings).