Research & Development
The development of ROWO is characterized by a high flexibility regarding our possible coating methods. In addition to proficient consulting in terms of finding the right solutions the customers of ROWO appreciate quick…
The development of ROWO is characterized by a high flexibility regarding our possible coating methods. In addition to proficient consulting in terms of finding the right solutions the customers of ROWO appreciate quick…
In order to achieve optimum adhesion even on low-energy surfaces, ROWO can subject the substrates to plasma modification. A plasma system upstream of the coating station enables us to clean…
For cathode sputtering we use magnetron sputtering, which has proven to be the most economical method in practice. In this process, the coating material is used in the form of…
During thermal evaporation, the wire-shaped coating material is continuously fed onto resistance-heated crucibles. The wire first liquefies and then passes into the gas phase in the form of a vapour…
PVD methods The physical vapor deposition processes are vacuum-based coating processes in which the coating material is transferred into the gas phase with the aid of physical processes and then…
Delaminations, cracks, impurities, porosities, wear or spalls are examples of effects which can be observed on the surface and cross-section of the tested elements. Each of these defectives is the…
Failure analysis and quality control based on high-resolution electron microscopy and spectroscopy Modern industry relies more and more heavily on quality control and quality assurance for manufactured parts. These are…
EDS (Energy Dispersive Spectroscopy) also known as Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA)…
The thickness of the layer is often a critical parameter that influences the usability of the manufactured elements. For special coatings made of precious and semi-precious metals, their thickness must…
One of the main use of the dual beam SEM/FIB (Scanning Electron Microscope) / (Focused Ion Beam) systems is the sample preparation for TEM (Transmission Electron Microscopy). In order for…