Identification of coating defects
Delaminations, cracks, impurities, porosities, wear or spalls are examples of effects which can be observed on the surface and cross-section of the tested elements. Each of these defectives is the…
Quality control
Failure analysis and quality control based on high-resolution electron microscopy and spectroscopy Modern industry relies more and more heavily on quality control and quality assurance for manufactured parts. These are…
EDS elemental analysis
EDS (Energy Dispersive Spectroscopy) also known as Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA)…
Coating Thickness Measurements
The thickness of the layer is often a critical parameter that influences the usability of the manufactured elements. For special coatings made of precious and semi-precious metals, their thickness must…
TEM lamella preparation
One of the main use of the dual beam SEM/FIB (Scanning Electron Microscope) / (Focused Ion Beam) systems is the sample preparation for TEM (Transmission Electron Microscopy). In order for…
FEMTOSECOND LASER WORKSTATION
The unique laser workstation, constructed by the Nanores team using independent elements, features a femtosecond laser, a highly precise tool that is designed to tackle the challenges posed by advanced…
Hardness measurements – NEMESIS 51000G2/A hardness tester
The fully automated NEMESIS 51000G2/A hardness tester allows for measurements using Brinell, Vickers, and Rockwell methods within the load range of 0.010 kgf to 250 kgf. It is a significant…
Metallographic laboratory setup
Our advanced laboratory setup facilitates the preparation of material samples for in-depth analysis. We have the capability to perform imaging using various techniques, including laser confocal microscopy, optical microscopy, scanning…
OLYMPUS LEXT 3D MEASURING LASER MICROSCOPE OLS5000-SAF CONFOCAL MICROSCOPE
The Olympus LEXT 3D confocal microscope allows for precise measurement of shape and surface roughness of samples at the submicron level. Performing accurate 3D measurements on a wide range of…
QUANTA 3D 200I ESEM/GA-FIB MICROSCOPE
Quanta 3D 200i ESEM/Ga-FIB microscope combines an electron microscope, based on a tungsten cathode, and an ion microscope. Its great advantage is the possibility of using three imaging modes: high…